Journal
International journal of methods in psychiatric research
Publication Date
5-17-2023
Volume
33
Issue
1
First Page
e1977
Document Type
Open Access Publication
DOI
10.1002/mpr.1977
Rights and Permissions
Oh, H., Karcher, N. R., Soffer-Dudek, N., Koyanagi, A., Besecker, M., & DeVylder, J. E. (2024). Distress related to psychotic experiences: Enhancing the world health organization composite international diagnostic interview psychosis screen. International Journal of Methods in Psychiatric Research, e1977. https://doi.org/10.1002/mpr.1977 © 2023 The Authors. International Journal of Methods in Psychiatric Research published by John Wiley & Sons Ltd. This is an open access article under the terms of the Creative Commons Attribution-NonCommercial-NoDerivs License, which permits use and distribution in any medium, provided the original work is properly cited, the use is non-commercial and no modifications or adaptations are made.
Recommended Citation
Oh, Hans; Karcher, Nicole R; Soffer-Dudek, Nirit; Koyanagi, Ai; Besecker, Megan; and DeVylder, Jordan E, "Distress related to psychotic experiences: Enhancing the World Health Organization Composite International Diagnostic Interview psychosis screen." International journal of methods in psychiatric research. 33, 1. e1977 (2023).
https://digitalcommons.wustl.edu/oa_4/3767
Department
ICTS (Institute of Clinical and Translational Sciences)
Additional Links
Supplemental material is available for this article at publisher site.
